NDLI: Predicting Scan Compression IP Configurations for Better QoR

Content Provider	IEEE Xplore Digital Library
Author	Saikia, J. Notiyath, P. Kulkarni, S. Anbalan, A. Uppuluri, R. Fernandes, T. Bhattacharya, P. Kapur, R.
Copyright Year	2011
Abstract	Scan compression technology is essentially IP that provides an interface between the scan-inputs/outputs and the internal scan chains. The IP configuration that is put into the design is based upon some user specified constraints that are related to the target compression and the available scan terminals. The configuration selected may or may not be the best suited for the design it is inserted in. Usually the compression IP can be configured in many different ways. Some configurations are better suited for particular designs than others. If one were able to predict the configuration of the compression IP to match the needs of the design then one would expect the best results from the compression technology. In this paper we describe a method to predict the optimum IP configuration for Adaptive Scan, which is a specific type of compression technology. The concepts and methodology discussed here are applicable to any compression scheme.
Starting Page	261
Ending Page	266
File Size	578016
Page Count	6
File Format	PDF
ISBN	9781457719844
ISSN	10817735
DOI	10.1109/ATS.2011.30
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-11-20
Publisher Place	India
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	IP networks Automatic test pattern generation Multiplexing Measurement Flip-flops Discrete Fourier transforms Reliability engineering scan compression prediction pattern sampling fault sampling
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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