NDLI: Characterizing Pattern Dependent Delay Effects in DDR Memory Interfaces

Content Provider	IEEE Xplore Digital Library
Author	Gupta, A. Kumar, A. Chhabra, M.
Copyright Year	2011
Abstract	Designing high speed Double Data Rate (DDR) memory interface controller in low cost wire-bond packages is a difficult goal to achieve. The interface is limited at speed because of various factors such as Inter Symbol Interference (ISI), Power Delivery Network (PDN) noise, Cross talk etc. At high speeds like 1Gbps, Pattern dependent effects have a major role to play in DDR link budget analysis. Hence, selecting the right data pattern for DDR interface characterization becomes an important problem to solve. Little data exists on what patterns to use for DDR bus characterization and still lesser silicon data exists. This paper is an attempt to create an analysis technique to characterize high speed DDR interfaces. A set of data patterns is proposed. They can be used to characterize any source synchronous parallel bus interfaces like DDR etc. These data patterns simultaneously capture the effects of ISI, PDN noise and Cross talk, the major sources of noise or uncertainty in this case. We have built a case for proving that these patterns are indeed the worst from DDR timing prospective. DDR design space can thus be reduced by concentrating on these worst case data patterns only as compared to the complete set of patterns. Further, silicon results are shared, to prove the efficiency of our approach.
Starting Page	425
Ending Page	431
File Size	618201
Page Count	7
File Format	PDF
ISBN	9781457719844
ISSN	10817735
DOI	10.1109/ATS.2011.14
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-11-20
Publisher Place	India
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Noise Crosstalk Resonant frequency Switches Reflection Timing Impedance Jitter DDR DDR3 Wire-bond ISI PDN noise SSN Reflections DSO Eye Diagram TIE
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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