NDLI: Parametric Testing of Optical Interfaces

Content Provider	IEEE Xplore Digital Library
Author	Achkir, B. Zivny, P. Eklow, B.
Copyright Year	2008
Abstract	This series will discuss board and system level testing of high speed optical interfaces. Today these interfaces operate up to 10 Gbps over short, medium and long ranges. In the not too distant future, these interfaces will be operating in ranges up to 40 Gbps. There are several factors that can affect the performance of board/system level high speed, serial interfaces, including signal integrity issues in the optics and at the board level, power and other components such as clocks. The application series will provide background on high speed serial interfaces and techniques used to test these interfaces. This background will include a discussion about optical and electrical parameters that are tested and how they could impact the performance of these interfaces. The application series will continue with a discussion of the different test techniques. One aspect of this will include a discussion of the lack of standardization in the measurements that are taken by test equipment. The application series will conclude by talking about future interfaces and what it will take to effectively tests those interfaces.
Starting Page	1
Ending Page	1
File Size	34276
Page Count	1
File Format	PDF
ISBN	9781424424023
ISSN	10893539
DOI	10.1109/TEST.2008.4700655
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-10-28
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Nonlinear optics High speed optical techniques System testing Optical devices Clocks Standardization Test equipment
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

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