NDLI: Evaluating the Effectiveness of Physically-Aware N-Detect Test using Real Silicon

Content Provider	IEEE Xplore Digital Library
Author	Yen-Tzu Lin Poku, O. Blanton, R.D. Nigh, P. Lloyd, P. Iyengar, V.
Copyright Year	2008
Description	Author affiliation: IBM Syst. & Technol. Group, Essex, VT (Nigh, P.; Lloyd, P.; Iyengar, V.) \|\| Dept. of ECE, Carnegie Mellon Univ., Pittsburgh, PA (Yen-Tzu Lin; Poku, O.; Blanton, R.D.)
Abstract	Physically-aware N-detect attempts to improve the detection characteristics of traditional N-detect by exploiting the localized characteristics of defects. Specifically, in addition to detecting each fault N times, we also require that the physical neighborhood surrounding the target change state as well. In this work, the effectiveness of the physically-aware metric is examined using two approaches. First, tester responses from an in-production IBM chip are analyzed to compare the physically-aware N-detect test with other traditional tests that include stuck-at, IDDQ, logic BIST, and delay tests. Second, diagnostic results from LSI chip failures are utilized to directly compare the traditional and physically-aware N-detect metrics. Results from both experiments demonstrate the effectiveness of physically-aware N-detect test in detecting defects in modern industrial designs.
Starting Page	1
Ending Page	9
File Size	904673
Page Count	9
File Format	PDF
ISBN	9781424424023
ISSN	10893539
DOI	10.1109/TEST.2008.4700606
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-10-28
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Silicon Fault detection Logic testing Large scale integration Costs Delay Clocks System testing Built-in self-test Application specific integrated circuits
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

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