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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Yin, C.Y. Lu, H. Bailey, C. Chan, Y.C. |
| Copyright Year | 2005 |
| Description | Author affiliation: Sch. of Comput. & Math. Sci., Greenwich Univ., London (Yin, C.Y.; Lu, H.; Bailey, C.) |
| Abstract | A wide range of flip chip technologies with solder or adhesives have become dominant solutions for high density packaging applications due to the excellent electrical performance, high I/O density and good thermal performance. This paper discusses the use of modeling technique to predict the reliability of high density packaged flip chips in the humid environment. Reliability assessment is discussed for flip chip package at ultra-fine pitch with anisotropic conductive film (ACF). The purpose of this modeling work is to understand the role that moisture plays in the failure of ACF flip chips. A macro-micro 3D finite element modeling technique was used in order to make the multi-length-scale modeling of the ACF flip chip possible. Modeling results are consistent with the findings in the experimental work |
| Starting Page | 1 |
| Ending Page | 4 |
| File Size | 360969 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780392922 |
| DOI | 10.1109/HDP.2005.251383 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2005-06-27 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Flip chip Moisture Assembly Capacitive sensors Temperature Gold Thermal stresses Electronics packaging Electronic packaging thermal management Predictive models |
| Content Type | Text |
| Resource Type | Article |
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