NDLI: Testing nanometer digital integrated circuits: myths, reality and the road ahead

Content Provider	IEEE Xplore Digital Library
Author	Blanton, S. Mitra, S.
Copyright Year	2005
Description	Author affiliation: Carnegie Mellon Univ., Pittsburgh, PA, USA (Blanton, S.)
Abstract	High-test quality plays a central role in the development of successful products used for building robust computing and communication systems. Hence, high-test quality enablers are rapidly becoming "features", just like performance, power-consumption and die size. This tutorial includes in-depth discussions on two major test topics that are essential for designs manufactured in nanometer technologies: test compression and diagnosis. Test compression techniques enable orders of magnitude improvement (reduction) in test cost and pave the path for successful implementation of built-in-self-test features. Ensuring products yield with sufficient quality also requires techniques for identifying and characterizing defects. This tutorial describes state-of-the-art techniques for performing defect diagnosis and how such techniques are key in enabling high-yielding and high-quality products. Supporting data from actual designs and manufacturing processes are presented.
Starting Page	8
Ending Page	9
File Size	34328
Page Count	2
File Format	PDF
ISBN	0769522645
ISSN	10639667
DOI	10.1109/ICVD.2005.162
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-01-03
Publisher Place	India
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Integrated circuit testing Digital integrated circuits Roads System testing Micromechanical devices Very large scale integration Robustness Manufacturing Automatic testing
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Hardware and Architecture

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in