NDLI: Analyzing life tests of CIS solar modules for degradation modeling

Content Provider	IEEE Xplore Digital Library
Author	Okuda, Y.
Copyright Year	2012
Description	Author affiliation: Solar Frontier K.K., Atsugi Kanagawa Japan (Okuda, Y.)
Abstract	Generally, accelerated life tests of electronics devices have been completed in dark chambers where thin-film solar cells show high degradations which have never happened at exposure experiences. Light soak free decrease paths show two phases: a relative steeper logarithmic decrease followed by a gradual linear decrease. These two phases are analyzed in complicated 1,000h damp heat test paths of 151 commercial CIS modules, demonstrating that the high degradation of the linear phase consistently occurs when the logarithmic phase ends. Furthermore, observed degradation gradients are affected by not only cell characteristics, but also test readout interval times, which corrupts life estimations such as underestimation of life, existence of pseudo failures, and missing actual failures. Therefore the life tests of CIS/thin-film cells in dark chambers require the paradigmshift such as neglect for pseudo-degradation or adapt to new light soaking related acceleration metrics.
File Size	140666
File Format	PDF
ISBN	9781457716782
ISSN	19381891
e-ISBN	9781457716805
e-ISBN	9781457716799
DOI	10.1109/IRPS.2012.6241925
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-04-15
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Degradation DH-HEMTs IEC standards Life estimation Silicon Histograms
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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