NDLI: Frequency Deviation Due to a Sample Insertion Hole in a Cylindrical Cavity by Circuital Analysis

Content Provider	IEEE Xplore Digital Library
Author	Penaranda-Foix, F.L. Catala-Civera, J.M. Canos-Marin, A.J. Garcia-Banos, B.
Copyright Year	2007
Description	Author affiliation: Tech. Univ. of Valencia, Valencia (Penaranda-Foix, F.L.; Catala-Civera, J.M.; Canos-Marin, A.J.; Garcia-Banos, B.)
Abstract	One of the most widely used techniques for dielectric material characterization is the partially filled circular cavity. The exact analysis of this structure is well known in the bibliography. But in practice when the measured material is introduced through a circular pipe below its cut off frequency a problem arises. Traditionally the tube effect is neglected, but then some errors appear, whose magnitude depends on the material properties and the cavity and tube dimensions. In some cases, the errors introduced are noticeable and the tube effect should not be neglected. Some authors have tried to evaluate in a simple way this effect, but their equations are valid only in a restricted range of practical configurations. In this paper we present a model of this effect based on a circuital analysis of the full structure. A simple monomode equation valid for any material property and cavity dimensions is given and a saturation effect, not reported before, is analyzed.
Starting Page	1683
Ending Page	1686
File Size	2103671
Page Count	4
File Format	PDF
ISBN	1424406870
ISSN	0149645X
DOI	10.1109/MWSYM.2007.380030
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-06-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit analysis Equations Dielectric materials Bibliographies Material properties Dielectric measurements Frequency measurement Cavity resonators Cavity perturbation methods Mode matching methods
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electrical and Electronic Engineering Radiation

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