NDLI: A higher dimensional theory of contact resistance

Content Provider	IEEE Xplore Digital Library
Author	Wilkin Tang Lau, Y.Y. Gilgenbach, R.M. Gomez, M.R. Zier, J.
Copyright Year	2008
Description	Author affiliation: Dept. of Nucl. Eng. & Radiol., Univ. of Michigan, Ann Arbor, MI (Wilkin Tang; Lau, Y.Y.; Gilgenbach, R.M.; Gomez, M.R.; Zier, J.)
Abstract	Electrical contact is an important issue for wafer evaluation of manufactured integrated circuits. It has also repeatedly surfaced in our ongoing studies of high power microwave sources, wire-array Z pinches, field emitters, and metal- insulator-vacuum junctions. Because of the surface roughness on a microscopic scale, true contact between two pieces of metal occurs only on the asperities of the two contacting surfaces. Current flows only through these asperities, which occupy a small fraction of the area of the nominal contacting surfaces. This gives rise to contact resistance. We have recently developed an analytic theory of the contact resistance of an asperity that has a finite axial length (h) connecting two metal blocks. We construct a scaling law for arbitrary aspect ratios of the asperity, with the h = 0 limit reducing to the classical "a-spot theory" of Holm and Timsit. While asperities of finite length may be a small step closer to reality, this higher-dimensional treatment could link the contact resistance to the geometrical deformations in response to an applied pressure, and eventually to the hardness of the material. Potential applications and extensions of the theory, such as the RF contact resistance, will be presented.
Starting Page	1
Ending Page	1
File Size	30220
Page Count	1
File Format	PDF
ISBN	9781424419296
ISSN	07309244
DOI	10.1109/PLASMA.2008.4591083
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-06-15
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Contact resistance Rough surfaces Surface resistance Surface roughness Contacts Metals Junctions
Content Type	Text
Resource Type	Article
Subject	Atomic and Molecular Physics, and Optics Condensed Matter Physics Electrical and Electronic Engineering

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