NDLI: Modelling of polycrystalline thin film solar cells: new features in SCAPS version 2.3

Content Provider	IEEE Xplore Digital Library
Author	Degrave, S. Burgelman, M. Nollet, P.
Copyright Year	2003
Description	Author affiliation: Dept. of Electron. & Information Syst., Ghent Univ., Gent, Belgium (Degrave, S.; Burgelman, M.; Nollet, P.)
Abstract	Modern characterisation of thin film solar cells is based on a variety of standard and advanced (opto-) electrical experiments. In the case of complicated structures, like most of the polycrystalline thin film solar cells, interpretation of such experiments is almost impossible without the help of simulation programs. In many cases numerical simulation of a thin film solar cell can lead to better insight into the details of physical operation. It can even give new insights to improve the technology. The numerical simulation tool SCAPS is developed at our lab to deal with polycrystalline thin film solar cells. The program is able to simulate standard experiments like I(V) and QE(/spl lambda/) as well as more advanced measurements like C(V) and C(f). The program is now in a state of extension to transient analysis; it will be able to simulate current and capacitance in function of time. Different methods to solve the time dependent problem and first results and observations of transient behaviour are treated in this article.
Starting Page	487
Ending Page	490
File Size	304688
Page Count	4
File Format	PDF
ISBN	4990181603
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2003-05-11
Publisher Place	Japan
Access Restriction	Subscribed
Rights Holder	PVSEC Advisory Committee
Subject Keyword	Transistors Photovoltaic cells Optical films Absorption Semiconductor thin films Numerical simulation Transient analysis Capacitance Voltage Lighting
Content Type	Text
Resource Type	Article

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