NDLI: A novel diagnosis method based on flexible error voltage for IGBTs open-circuit faults in voltage-source inverters

Content Provider	IEEE Xplore Digital Library
Author	Yuxi Wang Zhan Li Liaoyuan Lin
Copyright Year	2015
Description	Author affiliation: Coll. of Electr. Eng., Zhejiang Univ., Hangzhou, China (Yuxi Wang; Zhan Li; Liaoyuan Lin)
Abstract	This paper presents a novel diagnosis method based on error voltage for IGBTs open-circuit faults in dual-loop controlled voltage-source inverters. The phase voltage changes when open-circuit faults occur, and then there are error voltages of each phase which can be calculated directly by control algorithm with phase voltages and their corresponding flexible references both available from the main control system. Therefore, the proposed diagnosis method requires no additional sensors or electrical circuits to detect open-circuit faults, further with the features of fast diagnostic time, being suitable for various load conditions, strong robustness against false alarms and being easily inserted to the existing control algorithms as a subroutine. The experimental results are carried out to show the effectiveness of the proposed method.
Sponsorship	IEEE
Starting Page	000019
Ending Page	000024
File Size	1344452
Page Count	6
File Format	PDF
e-ISBN	9781479917624
DOI	10.1109/IECON.2015.7392958
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-11-09
Publisher Place	Japan
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit faults Voltage control Insulated gate bipolar transistors Inverters Switches Robustness Threshold voltage error voltage open-circuit faults fault diagnosis dual-loop controlled voltage-source inverter
Content Type	Text
Resource Type	Article

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