NDLI: Exploring patent quality indicators in pre-filing stage: Development of propositions and suggestion of research method

Content Provider	IEEE Xplore Digital Library
Author	Chien-Tzu Tsai Hui-Yu Shih Wang, B. Tai-Jun Chen Chan-Chih Chang
Copyright Year	2012
Description	Author affiliation: Feng Chia University, Management of Technology Institute, Taichung City, Taiwan (Chien-Tzu Tsai; Hui-Yu Shih) \|\| Industrial Technology Research Institute, Technology Transfer Center, Hsinchu, Taiwan (Wang, B.; Tai-Jun Chen; Chan-Chih Chang)
Abstract	Patent has been considered as an important asset nowadays. People pursue the increase of patent quantity whereas less attention has been paid on the patent quality. Patent growth without quality assurance may result in financial and management burden that comes from great maintenance cost and unsatisfied profit-returned of these patents. To raise the ROI (return-of-investment) of patent filing, especially under the tough conditions: limitation of R&D funds and high risk of involving in patent litigation, people have gradually realized how important the patent quality is. Nevertheless, prior studies on the indicators of patent quality mostly focused on post-granted patents, little understanding of what indicators or criteria really help to assess patent quality in pre-filing stage. This paper aims to explore indicators for evaluating quality before formally filing patent application. Through comprehensively reviewing existing literature, collecting practitioners' technical reports, and survey of experts' opinions, we developed a series of criteria and indicators for patent quality, including several constructs, e.g. possibility for being granted, potential market value, competitiveness in litigation etc. These indicators are expected to help the decision for patent filing and enhancing the quality of patents, ultimately reducing cost of patent maintenance and increasing patent value.
Starting Page	916
Ending Page	922
File Size	727919
Page Count	7
File Format	PDF
ISBN	9781467328531
e-ISBN	9781890843250
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-07-29
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	PICMET (Portland Intl conf on Manage
Subject Keyword	Patents Maintenance engineering Technological innovation
Content Type	Text
Resource Type	Article

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