NDLI: A testing system for the performance evaluation of electrical machines under realistic voltage fluctuations

Content Provider	IEEE Xplore Digital Library
Author	Bucci, G. Fiorucci, E. Ciancetta, F. Rotondale, N.
Copyright Year	2010
Description	Author affiliation: Dipartimento di Ingegneria Elettrica e dell'Informazione, Università dell'Aquila, L'Aquila (Italy) (Bucci, G.; Fiorucci, E.; Ciancetta, F.; Rotondale, N.)
Abstract	The electrical voltage fluctuations and their negative effects on industrial and domestic apparatuses represent one of the most interesting topics of research in the field of Power Quality. Early studies investigated the behavior of different types of lamps in presence of voltage amplitude modulations and the design of light flicker meters. In realistic conditions, the observed voltage fluctuations have usually more complex shapes, that are quite different from the rectangular or sinusoidal amplitude modulations defined in the IEC standard. In this paper we are mostly concerned with the development of an innovative testing system for the performance evaluation of electrical machines under realistic voltage fluctuations, whose parameters are suggested by international organizations. The desired amplitude fluctuations are obtained by introducing time variable current absorption in an ad hoc power electronic apparatus which is parallel connected to the electrical loads, as it frequently occurs in the real working conditions. A PC, hosting a DAQ board and an IEEE 488 board, performs the data acquisition of electrical and mechanical quantities and controls the firing unit. The proposed system can be adopted for testing electrical motors and transformers, as well as adjustable speed drives, by reproducing a wide set of voltage fluctuation shapes for long duration testing. The proposed technique can be also adopted for the generation of transitory voltage imbalances.
Starting Page	1441
Ending Page	1446
File Size	1041921
Page Count	6
File Format	PDF
ISBN	9781424428328
ISSN	10915281
DOI	10.1109/IMTC.2010.5488191
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-05-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	System testing Voltage fluctuations Amplitude modulation Shape Data acquisition Power quality Lamps IEC standards Absorption Power electronics power measurement Voltage fluctuactions power quality testing system
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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