NDLI: Compact instrumentation for radiation tolerance test of flash memories in space environment

Content Provider	IEEE Xplore Digital Library
Author	Pace, C. Libertino, S. Crupi, I. Marino, A. Lombardo, S. Sala, E.D. Capuano, G. Lisiansky, M. Roizin, Y.
Copyright Year	2010
Description	Author affiliation: CNR-IMM, Catania, Italy (Marino, A.; Sala, E.D.; Capuano, G.) \|\| Techno System Developments s.r.l., Pozzuoli (NA), Italy (Libertino, S.; Crupi, I.) \|\| Department of Electronics, Computer Science and Systems, University of Calabria, Rende (CS), Italy (Pace, C.) \|\| MATIS Unit, Catania, Italy (Lombardo, S.) \|\| Tower Semiconductor Ltd., Migdal HaEmek, Israel (Lisiansky, M.; Roizin, Y.)
Abstract	Aim of this work is the description of a test equipment, designed to be integrated on board of a microsatellite, able to investigate the radiation tolerance of non-volatile memory arrays in a real flight experiment. An FPGA-based design was adopted to preserve a high flexibility degree. Besides standard Program/Read/Erase functions, additional features such as failure data screening and latch-up protection have been implemented. The instrument development phase generated, as a by-product, a non-rad-hard version of the instrument that allowed performing in-situ experiments using $^{60}Co$ and 10 MeV Boron irradiation facilities on Ground. Preliminary measurement results are reported to show the instrumentation potential.
Starting Page	652
Ending Page	655
File Size	1335367
Page Count	4
File Format	PDF
ISBN	9781424428328
ISSN	10915281
DOI	10.1109/IMTC.2010.5488118
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-05-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Instruments Flash memory Nonvolatile memory Satellites Electronic equipment testing Test equipment Electronic components Performance evaluation System testing Poles and towers FPGA-based instrumentation space equipment non-volatile memory radiation hardness
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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