NDLI: Functional tests of field programmable analog arrays under the influence of electromagnetic radiation

Content Provider	IEEE Xplore Digital Library
Author	Baccigalupi, A. Liccardo, A. Lo Sapio, V. Pasquino, N.
Copyright Year	2010
Description	Author affiliation: Dept. of Electrical Engineering, University of Naples Federico II, Via Claudio, 21 - 80125, Italy (Lo Sapio, V.; Pasquino, N.) \|\| Dept. of Computer Science and Systems, University of Naples Federico II, Via Claudio, 21 - 80125 Italy (Baccigalupi, A.; Liccardo, A.)
Abstract	Functional tests of field programmable analog arrays (FPAA) are required to assess tolerance to uncontrolled and unintentional variations in the components characteristic parameters, like for example a change in the values of capacitances and gains of the differential amplifiers which may be due to aging, uncertainty (i.e., a difference between the actual and nominal values), or to an outer disturbance like radiated electromagnetic energy. The paper focuses on the latter as a cause for a possible faulty behavior: experimental results have shown that the expected performances are distorted by the presence of noise added to the useful signals due to the coupling of the external electromagnetic field with the circuitry. The results indicate that the susceptibility features depend only marginally on the specific configuration given to the FPAA, leading to the conclusion that the topology and electromagnetic characteristics of the board on which the device is mounted must be carefully designed.
Starting Page	224
Ending Page	228
File Size	1057431
Page Count	5
File Format	PDF
ISBN	9781424428328
ISSN	10915281
DOI	10.1109/IMTC.2010.5488169
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-05-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Testing Field programmable analog arrays Electromagnetic radiation Electromagnetic fields Capacitance Differential amplifiers Aging Uncertainty Circuit faults Distortion
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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