NDLI: Method for measuring the twist angle of an optically compensation bend by using the heterodyne interferometry

Content Provider	IEEE Xplore Digital Library
Author	Shinn-Fwu Wang Lai, W. Jyh-Shyan Chiu Rih-Huei Yeh Heng-Cheng Tseng Wei-Chou Chen
Copyright Year	2010
Description	Author affiliation: Department of Electronic Engineering, Ching Yun University, Jhongli City, Taoyuan County, Taiwan (Shinn-Fwu Wang; Lai, W.; Jyh-Shyan Chiu) \|\| Research & Development Center, HannStar Display Corporation, Tainan County, Taiwan (Heng-Cheng Tseng; Wei-Chou Chen) \|\| Institute of Computer, Communication and System Engineering, Ching Yun University, Jhongli City, Taoyuan County, Taiwan (Rih-Huei Yeh)
Abstract	A new measuring method based on the common-path heterodyne interferometry is used to determine the twist angle, pre-tilt angle, and cell gap of an optically compensation bend (OCB) liquid crystal (LC) cell. In this paper, the twist angle of an OCB LC cell can be determined by measurement the phase difference instead of the reflectance difference. Because the measuring system is based on the common-path heterodyne interferometry, it can provide the most sensitive way to measure the twist angle of an OCB LC cell against the air turbulence and environmental vibrations. The method has some merits, e.g., a simple setup, in real-time test and reliability, etc.
Starting Page	296
Ending Page	299
File Size	709936
Page Count	4
File Format	PDF
ISBN	9781424428328
ISSN	10915281
DOI	10.1109/IMTC.2010.5488151
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-05-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Optical interferometry Goniometers Optical mixing Liquid crystal displays Electrooptic modulators Light sources Optical retarders Optical sensors Phase measurement Vibration measurement liquid crystal display (LCD) optically compensation bend (OCB) twist angle heterodyne interferometry (HI)
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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