NDLI: A model-based probabilistic inversion framework for wire fault detection using TDR

Content Provider	IEEE Xplore Digital Library
Author	Schuet, S.R. Timucin, D.A. Wheeler, K.R.
Copyright Year	2010
Description	Author affiliation: NASA Ames Research Center, Intelligent Systems Division, Moffett Field, CA 94035, USA (Schuet, S.R.; Timucin, D.A.; Wheeler, K.R.)
Abstract	Time-domain reflectometry (TDR) is one of the standard methods for diagnosing faults in electrical wiring and interconnect systems, with a long-standing history focused mainly on hardware development of both high-fidelity systems for laboratory use and portable hand-held devices for field deployment. While these devices can easily assess distance to hard faults such as sustained opens or shorts, their ability to assess subtle but important degradation such as chafing remains an open question. This paper presents a unified framework for TDR-based chafing fault detection in lossy coaxial cables by combining an S-parameter based forward modeling approach with a probabilistic (Bayesian) inference algorithm. Results are presented for the estimation of nominal and faulty cable parameters from laboratory data.
Starting Page	422
Ending Page	425
File Size	655790
Page Count	4
File Format	PDF
ISBN	9781424428328
ISSN	10915281
DOI	10.1109/IMTC.2010.5488164
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-05-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Wire Fault detection Laboratories Coaxial cables Electrical fault detection Time domain analysis Reflectometry Standards development Wiring History
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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