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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Fukushima, T. Ohara, Y. Bea, J. Murugesan, M. Kang-Wook Lee Tanaka, T. Koyanagi, M. |
| Copyright Year | 2011 |
| Description | Author affiliation: New Industry Creation Hatchery Center (NICHe), Tohoku University, 6-6-10, Aza-Aoba, Aramaki, Aoba-ku, Sendai, Miyagi 980-8579, Japan (Fukushima, T.; Bea, J.; Murugesan, M.; Kang-Wook Lee; Koyanagi, M.) || Dept. of Bioengineering and Robotics, Graduate School of Engineering, Tohoku University (Ohara, Y.; Tanaka, T.) |
| Abstract | We have demonstrated bonding strength control for self-assembly-based 3D integration in which many chips are instantly assembled on a wafer all at once by using liquid droplets, and then, temporarily bonded to the wafer. The wafer is named Reconfigured Wafer. The self-assembly-based multichip-to-wafer 3D stacking is called reconfigured-wafer-to-wafer 3D integration. The alignment accuracy is found to be within 1 μm and the temporal bonding strength is well controlled by the quality of oxides as a bonding interface material, liquid types (concentration of additives), total bonding area, and surface roughness of the oxides. The self-assembled and temporarily bonded chips are successfully transferred to another wafer in a face-to-face bonding manner in batch processing. |
| Starting Page | 1 |
| Ending Page | 4 |
| File Size | 404336 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781467321891 |
| e-ISBN | 9781467321907 |
| DOI | 10.1109/3DIC.2012.6262954 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2012-01-31 |
| Publisher Place | Japan |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Self-assembly Liquids Stacking Surface roughness Rough surfaces Bonding Electron devices |
| Content Type | Text |
| Resource Type | Article |
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