NDLI: Distance measurement in air with a femtosecond frequency comb

Content Provider	IEEE Xplore Digital Library
Author	Cui, M. Zeitouny, M.G. Bhattacharya, N. van den Berg, S.A. Urbach, H.P.
Copyright Year	2009
Description	Author affiliation: NMi Van Swinden Laboratory, Thijsseweg 11, 2629 JA Delft, The Netherlands (van den Berg, S.A.) \|\| Optics Research Group, Department of Applied Sciences, Technical University Delft, Lorentzweg 1, 2628 CJ, The Netherlands (Cui, M.; Zeitouny, M.G.; Bhattacharya, N.; Urbach, H.P.)
Abstract	A femtosecond frequency comb is a powerful tool in a wide range of metrological applications, one of them being in the field of distance measurement. Due to the locking of the repetition rate of the laser to a time standard, the distance between successive pulses is accurately known, providing direct traceability to the SI definition of the meter. Since the interpulse distance is typically of the order of 1 m, the range of non-ambiguity is large. Such accuracy is easily obtained with other methods like time-of-flight measurements. Several schemes for distance measurement have been proposed and demonstrated [1–4]. In this paper we report on measurement of distances up to 20 m in air, that have been acquired using a scheme based on a Michelson interferometer. The interferometer consists of a long measurement arm and a short reference arm that can be adjusted such that the path length difference between both arms is a multiple of the interpulse distance. Once this is the case, a cross-correlation function can be measured by scanning the reflector of the reference arm with a piezo element. The path-length difference between both arms is then determined from the the center of the cross-correlation function and the interpulse distance, taking into account the refractive index of air.
Starting Page	1
Ending Page	1
File Size	238660
Page Count	1
File Format	PDF
ISBN	9781424440795
DOI	10.1109/CLEOE-EQEC.2009.5196366
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-06-14
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Optical interferometry Shape measurement Refractive index Optimized production technology Length measurement Frequency Distance measurement Ultrafast optics Arm Optical pulses
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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