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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Maiwald, R. Leibfried, D. Britton, J. Bergquist, J.C. Leuchs, G. Wineland, D.J. |
| Copyright Year | 2009 |
| Description | Author affiliation: Time and Frequency Division, National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA (Leibfried, D.; Britton, J.; Bergquist, J.C.; Wineland, D.J.) || Max Planck Institute for the Science of Light, Günther-Scharowsky-Str. 1 / Bldg. 24, 91058 Erlangen, Germany (Maiwald, R.; Leuchs, G.) |
| Abstract | The properties of single atomic ions allow them to be used as sensitive probes to measure a multitude of physical effects, ranging from light field distributions to weak force fields, for example electric or magnetic fields. However trapping and controlling ions reliably calls for a more or less encompassing electrode configuration, that depending on the realization can block a substantial amount of access to the ion. Here we present a novel radio-frequency (rf) ion trap geometry that reduces the solid angle obstructed by trap electrodes to a minimum. Since access and proper ion confinement are inherently opposing goals, we realized three different traps with access ranging from 71% to 96% of 4π to characterize the trade-offs. Fabrication, characterization, as well as promising applications of similar traps in quantum optics and field sensing are discussed. |
| Starting Page | 1 |
| Ending Page | 1 |
| File Size | 254798 |
| Page Count | 1 |
| File Format | |
| ISBN | 9781424440795 |
| DOI | 10.1109/CLEOE-EQEC.2009.5192303 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-06-14 |
| Publisher Place | Germany |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Electrodes Atomic measurements Geometry Particle beam optics Magnetic field measurement Force measurement Optical device fabrication Charge carrier processes Optical sensors Probes |
| Content Type | Text |
| Resource Type | Article |
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