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Content Provider | IEEE Xplore Digital Library |
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Author | Bum, Lee Jong Yuan, Hwang How Chih, Pan Wei Daniel, Rhee Min Woo |
Copyright Year | 2015 |
Description | Author affiliation: Heraeus Materials Singapore Pte Ltd, Global Business Unit Heraeus Electronics. 10 Ang Mo Kio Street 65, Singapore 569059 (Chih, Pan Wei) || Institute of Microelectronics, A∗STAR (Agency for Science, Technology and Research) 11 Science Park Rd, Singapore Science Park II, Singapore 117685 (Bum, Lee Jong; Yuan, Hwang How; Daniel, Rhee Min Woo) |
Abstract | Lead-free solder alloys for high temperature applications is required to meet increasing demands for reliable replacements for lead-based alloys. Especially, high temperature solder is required for bonding in power electronics packages where first bonding on a lead-frame is performed at a temperature of about 330 °C. In this study, the SiC based TO-220 power package was developed by applying high temperature endurable material sets which can endure over 220°C device junction temperature. The interfacial reaction and reliability of SiC die attachment on and Ni plated lead frames using Zn-Al based solder was investigated. Zn-Al-Ge solder alloy showed good temperature tolerance after temperature cycle (TC), high temperature storage test whereas Zn-Al-Ge-Mg solder alloy showed failures after TC test. |
Starting Page | 1 |
Ending Page | 5 |
File Size | 4674875 |
Page Count | 5 |
File Format | |
e-ISBN | 9781467372695 |
DOI | 10.1109/EPTC.2015.7412304 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2015-12-02 |
Publisher Place | Singapore |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | High-temperature superconductors Image edge detection Reliability Lead Silicon carbide Bonding |
Content Type | Text |
Resource Type | Article |
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