NDLI: The effects of large signals on charge collection in photoconductive X-ray image detectors

Content Provider	IEEE Xplore Digital Library
Author	Kabir, M.Z. Yunus, M. Kasap, S.O.
Copyright Year	2005
Description	Author affiliation: Dept. of Electr. Eng., Saskatchewan Univ., Saskatoon, Sask. (Kabir, M.Z.; Yunus, M.; Kasap, S.O.)
Abstract	A model for studying the effects of large signals on charge collection efficiency in amorphous selenium based X-ray image detectors is described by considering bimolecular recombination between drifting charge carriers and space charge effects. The continuity equations for both holes and electrons, and the Poisson's equation across the photoconductor for a short step X-ray exposure are simultaneously solved by the finite difference method. The numerical results are compared with the Monte Carlo simulation results. It is found that the recombination plays practically no role on charge collection up to the total carrier generation rate $q_{0}$ of $10_{19}$ $EHPs/m^{2}-s$ at the applied electric field of 10 V/mum. At large values of q0 , the charge collection efficiency gradually decreases with increasing $q_{0}$ and approaches almost zero at $q_{0}$ larger than $10^{24}$ $EHPs/m^{2}-s.$ The effect of recombination on charge collection increases with decreasing applied electric field and increasing the normalized absorption depth (absorption depth per unit thickness)
Starting Page	208
Ending Page	210
File Size	205903
Page Count	3
File Format	PDF
ISBN	0780388852
ISSN	08407789
DOI	10.1109/CCECE.2005.1556911
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-05-01
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Photoconductivity X-ray imaging X-ray detection X-ray detectors Spontaneous emission Poisson equations Absorption Amorphous materials Charge carriers Space charge
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Hardware and Architecture

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