NDLI: Tuning of Anisotropy in IrMn/CoFe Exchange Bias Systems

Content Provider	IEEE Xplore Digital Library
Author	Aley, N.P. Kroeger, R. Lafferty, B. Agnew, J. Lu, Y. O'Grady, K.
Copyright Year	1965
Abstract	In this paper, we report an enhancement of the anisotropy constant K _AFof IrMn/CoFe exchange bias systems with the variation of the NiCr seed layer thickness. This is related to an increase in the (111) texture of IrMn parallel to the interface. Silang100rang /NiCr (Xnm)/IrMn (7 nm)/CoFe (3 nm)/Ta (10 nm) with X= 2, 4, 6, 10, 15, 20 nm were prepared by direct current (dc) sputtering. X-ray diffraction studies revealed a peak in the (111) texture of the IrMn parallel to the interface for the samples with a 6-nm NiCr seed layer which reduced with increasing NiCr thickness. NiCr seed layer thicknesses of 2, 4, and 20 nm had negligible (111) texture. Measurement of the grain size distribution and thermal activation measurements were used to calculate the anisotropy constant of the IrMn. This was found to increase from (0.4 plusmn 0.1) times 10⁷ ergs/cm³ for the sample with a 20-nm NiCr seed layer to (4.5 plusmn 2) times10⁷ ergs/cm³ for the sample with a 6-nm NiCr seed layer. TEM studies of the seed layers showed the 6-nm NiCr layer was amorphous/nanocrystalline, and the grain size increased with NiCr thickness. This change in the morphology of the seed layer results in a lattice mismatch with the IrMn reducing the (111) texture of the IrMn and hence K _AF . This allows tuning of the anisotropy by controlling the lattice mismatch between the seed layer and the IrMn.
Sponsorship	IEEE Magnetics Society
Starting Page	3869
Ending Page	3872
Page Count	4
File Size	2096902
File Format	PDF
ISSN	00189464
Volume Number	45
Issue Number	10
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-10-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Anisotropic magnetoresistance Sputtering Size measurement Grain size X-ray diffraction Lattices Thermal stability Physics Amorphous materials Morphology thermal stability Exchange bias IrMn texture
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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