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Content Provider | IEEE Xplore Digital Library |
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Author | Yue Liu Takano, K. Bai, D. Xiaofeng Zhang Kowang Liu Yan Wu Dovek, M. |
Copyright Year | 1965 |
Abstract | Side track erasure (STE), either skip or far track, has been studied for a PMR writer with side shielded (SS) design. Both bit error rate (BER) and noise amplitude based STE measurements indicate the side writing fields are strong at SS bottom corners and/or inner edges. With DC background low-frequency noise amplitude measurement, the root cause of the STE is characterized as flux from main pole tip going into media soft under-layer (SUL) and returning to SS bottom corners and/or inner edges. Moreover, the return flux path is identified with a unique one-sided signature depending on the pole polarity and shield initialization direction and can switch side when pole polarity or shield initialization direction is changed. By employing magnetic force microscope (MFM) analysis of a SS head under two shield initialization directions, we can explain this unique one-sided flux path by the observed SS domain structure. Furthermore, a micro-magnetic modeling of the SS design is constructed to understand the observation qualitatively. |
Sponsorship | IEEE Magnetics Society |
Starting Page | 3660 |
Ending Page | 3663 |
Page Count | 4 |
File Size | 864444 |
File Format | |
ISSN | 00189464 |
Volume Number | 45 |
Issue Number | 10 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2009-10-01 |
Publisher Place | U.S.A. |
Access Restriction | One Nation One Subscription (ONOS) |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Bit error rate Low-frequency noise Magnetic field measurement Noise measurement Switches Magnetic force microscopy Noise level Writing Magnetic forces Magnetic analysis side track erasure Magnetic force microscope perpendicular recording side shields |
Content Type | Text |
Resource Type | Article |
Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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