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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Wang, Z.-H. Ding, Y. Tu, C.-S. Lin, T.-C. Yao, Y.D. Wu, K.T. |
| Copyright Year | 1965 |
| Abstract | In situ X-ray diffraction of BiFeO3 (BFO) ceramic and thin film has been carried out as a function of temperature (25degC-900degC) upon heating. The BFO thin film was deposited on Pt/TiOx/SiOx/Si(100) substrate by radio-frequency magnetron sputtering at 650degC. BFO thin film exhibits a structural transformation from rhombohedral to cubic in the region of 700-750degC upon heating. The magnetic property of BiFeO3/Co/BiFeO3 multilayer structure changes from diamagnetic to ferromagnetic phases with increasing thickness of Co layer. The dielectric permittivities (real and imaginary parts) of BiFeO3 ceramic exhibit a frequency-dependent relaxation-like behavior and its magnitude (real part) is higher than 1000 for f les 1 MHz. Surface morphology shows that the root-mean-square roughness of BFO thin film varies with sputtering power. |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 4341 |
| Ending Page | 4344 |
| Page Count | 4 |
| File Size | 309962 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 45 |
| Issue Number | 10 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-10-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Sputtering Ceramics Heating Dielectric thin films X-ray imaging X-ray diffraction Temperature Substrates Radio frequency Magnetic properties magnetoelectric BiFeO $_{3}$ dielectric permittivity films |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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