NDLI: High frequency measurements of CoFeHfO thin films

Content Provider	IEEE Xplore Digital Library
Author	Russek, S.E. Kabos, P. Silva, T. Mancoff, F.B. Dexin Wang Zhenghong Qian Daughton, J.M.
Copyright Year	1965
Abstract	High-frequency measurements of the transverse susceptibility and damping constant of CoFeHfO thin films have been made over a frequency range of 0.1 GHz to 6 GHz as a function of film resistivity, thickness, and temperature. The film resistivity varied from 250 /spl mu//spl Omega/cm to 2100 /spl mu//spl Omega/cm. The films show relatively low damping at high frequencies with the damping constant /spl alpha/ ranging from 0.01 to 0.06. The damping constant increases with film resistivity and, for the highest resistivity films, the damping constant decreases as the thickness increases. The damping constant, induced anisotropy, and film resistivity show weak temperature dependence over a temperature range from 4 K to 300 K. The low damping constant, in conjunction with the high anisotropy, large resistivity, and large spin-dependent-tunneling magnetoresistance, makes this material attractive for several high-frequency magnetic device applications.
Sponsorship	IEEE Magnetics Society
Starting Page	2248
Ending Page	2250
Page Count	3
File Size	64956
File Format	PDF
ISSN	00189464
Volume Number	37
Issue Number	4
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-07-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Frequency measurement Transistors Damping Conductivity Temperature distribution Temperature dependence Magnetic materials Thickness measurement Magnetic films Magnetoresistance
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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