NDLI: Characteristics of spin-valve films with non-magnetic oxide layers for specular-scattering

Content Provider	IEEE Xplore Digital Library
Author	Mizuguchi, T. Kano, H.
Copyright Year	1965
Abstract	We found a new spin-valve structure in which low coercivity coexists with high GMR ratio is substrate/Ta/NiFe/PtMn/CoFe/Ru/Ox/CoFe/Cu/CoFe/Cu/Ta-O. "Ox" means that Ru layer surface was exposed to oxygen gas. In this structure, the free layer is separated from the top specular layer by a copper layer and shows no increase in coercivity. Furthermore, the free layer was well oriented due to the thin oxide layer in the bottom pinned layer and the coercivity did not increase. After annealing at 295/spl deg/C, GMR and the exchange-bias field showed little change, which meant the oxide layers were stable. For the structure glass/Ta [3 nm]/NiFe [2 nm]/PtMn [10 nm]/CoFe [1.5 nm]/Ru [0.8 nm]/Ox/CoFe [2 nm]/Cu [2 nm]/CoFe [2 nm]/Cu [1 nm]Ta-O [1 nm], GMR ratio of 14.9% and change in sheet resistance of 3.3 ohms were obtained. The coercivity of the free layer exhibited 0.4 Oe.
Sponsorship	IEEE Magnetics Society
Starting Page	1742
Ending Page	1744
Page Count	3
File Size	82551
File Format	PDF
ISSN	00189464
Volume Number	37
Issue Number	4
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-07-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Coercive force Copper Glass Annealing Surface morphology Iron Atomic force microscopy Surface resistance Scattering Oxidation
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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