NDLI: Analysis of random telegraph noise in spin valve heads with ultra-thin free layers

Content Provider	IEEE Xplore Digital Library
Author	Jing Zhang Ningjia Zhu Yiming Huai Prabhakar, A. Rana, P. Seagle, D. Lederman, M.
Copyright Year	1965
Abstract	Random telegraph noise (RTN) in spin valve heads with ultra-thin free layers is analyzed in both time and frequency domain. RTN is characterized by random fluctuation between two meta-stable states and is attributed to thermally activated domain instability. Lifetime of each meta-stable state is changes with bias current, with both being equal when RTN amplitude peaks while asymmetry is near zero. The lifetime at equilibrium can be quantified by the flatness of RTN spectra and is correlated with the normalized peak area under RTN amplitude versus bias current curve. This area scales with the energy barrier associated with RTN. With the same RTN peak area, lifetime at equilibrium is shorter for heads with thinner free layers but otherwise the same structure. Impact on reader instability for ultra-high areal density recording is discussed.
Sponsorship	IEEE Magnetics Society
Starting Page	1678
Ending Page	1680
Page Count	3
File Size	101683
File Format	PDF
ISSN	00189464
Volume Number	37
Issue Number	4
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-07-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Telegraphy Spin valves Magnetic heads Noise level Fluctuations Energy barrier Acoustical engineering Magnetic noise Time domain analysis Noise measurement
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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