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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Vernik, I.V. Herr, Q.P. Gaij, K. Feldman, M.J. |
| Copyright Year | 2002 |
| Abstract | Circuit parameter variations resulting from the fabrication process affect the timing parameters of rapid single flux quantum (RSFQ) digital circuits. This determines the maximum clock rate and the yield of the circuit. It is generally believed that the global parameter variations (target-to-wafer) are much more significant in this regard than the local parameter variations (on-chip), but there has been little experimental evidence for this. This experiment measures the distribution of local parameter variations of the timing parameter of RSFQ circuits. The experiment consists of a 10 by 10 matrix of nominally identical RSF~ "clock rings" covering an integrated circuit area, a total of 3500 Josephson junctions. Each ring is activated individually, and its frequency is measured with accuracy better than 1%. |
| Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
| Starting Page | 4341 |
| Ending Page | 4344 |
| Page Count | 4 |
| File Size | 536604 |
| File Format | |
| ISSN | 10518223 |
| Volume Number | 9 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1999-06-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Timing Clocks Fabrication Digital circuits Josephson junctions Electrical resistance measurement Quantum computing Frequency measurement Integrated circuit measurements Robustness |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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