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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Benvenuti, C. Calatroni, S. Campisi, I.E. Darriulat, P. Peck, M.A. Russo, R. Valente, A.-M. |
| Copyright Year | 2002 |
| Abstract | A systematic study of the superconducting properties of niobium films deposited on the inner wall of copper radiofrequency cavities is presented. Films are grown by sputtering with different discharge gases (Xe, Kr, Ar and Ar/Ne mixtures) on substrates prepared under different conditions. The measured quantities include the surface resistance at 1.5 GHz, the critical temperature and the penetration depth. The surface resistance is analyzed in terms of its dependence on temperature, RF field and the density of trapped fluxons. Once allowance for electron scattering is made by means of a single mean free path parameter, good agreement with BCS theory is observed. The residual resistance is observed to be essentially noncorrelated with the superconducting properties, although influenced by specific coating conditions. On occasions, very low residual resistances, in the nano-ohm range, have been maintained over a broad range of RF field, indicating the absence of fundamental limitations specific to the film technology in practical applications. |
| Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
| Starting Page | 900 |
| Ending Page | 903 |
| Page Count | 4 |
| File Size | 347974 |
| File Format | |
| ISSN | 10518223 |
| Volume Number | 9 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1999-06-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Surface resistance Niobium Copper Superconducting films Surface discharges Radio frequency Argon Sputtering Gases Substrates |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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