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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Rylyakov, A.V. Schneider, D.F. Polyakov, Yu.A. |
| Copyright Year | 2002 |
| Abstract | We present the results of low- and high-speed testing of a fully integrated all-digital one-bit RSFQ autocorrelator for short-millimeter and submillimeter wave spectrometry applications. The 16-channel device, complete with a 16/spl times/9 array of binary counters, on-chip double-oversampling quantizer and on-chip clock was operational at clock speeds of up to 11 GHz. The total number of Josephson junctions in the design was 1672, while the estimated total power dissipation was less than 0.1 mW. For high-speed testing of the device we have developed a specialized 16-channel room-temperature interface capable of real-time data acquisition at a 16 Mbps-per-channel output rate. Extensive high-speed on-chip testing of the autocorrelator has also been performed, both in analog and digital modes, in the latter mode with an additional on-chip clock controller. All chips were fabricated in HYPRES' standard 3.5 /spl mu/m-10 /spl mu/A//spl mu/m/sup 2/ Nb-trilayer process. We also present a new concept of a 128-channel autocorrelator system built on 8 independent identical chips with approximately 2,500 Josephson junctions per chip, i.e. within the reach of the present-day fabrication technology. |
| Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
| Starting Page | 3623 |
| Ending Page | 3627 |
| Page Count | 5 |
| File Size | 626089 |
| File Format | |
| ISSN | 10518223 |
| Volume Number | 9 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1999-06-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Autocorrelation Testing Clocks Josephson junctions Submillimeter wave devices Spectroscopy Counting circuits Power dissipation Data acquisition Performance evaluation |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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