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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Radaelli, D. Puchner, H. Skip Wong Daniel, S. |
| Copyright Year | 1963 |
| Abstract | Multi-bit upset (MBU) events collected from accelerated soft error rate (SER) measurements performed with a quasi-monoenergetic neutron beam were analyzed with a threefold purpose. The first goal was to qualitatively assess the applicability and effectiveness of single-bit Error Detection And Correction algorithms and circuits (EDAC). The second goal was to investigate the relationship with the memory core P-well tapping scheme. And the third goal was to identify "preferred" MBU shapes. The results showed that the memory architecture is critical in affecting the single-bit EDAC effectiveness. Also, it was put in evidence that the tapping scheme is very effective in reducing the MBU rate. And finally it was noted that the predominant MBU shape is strongly influenced by the vertical and horizontal distance of the active nodes of the memory cells. |
| Sponsorship | IEEE Nuclear and Plasma Sciences Society Computer Applications in Nuclear and Plasma Sciences (CANPS) Lawrence Berkeley Lab. Lawrence Livermore Nat. Lab. APS College of William and Mary Continuous Electron Beam Accelerator Facility NASA Defence Nuclear Agency Sandia National Laboratories Jet Propulsion Laboratory Brookhaven Nat. Lab. Lawrence Livermore Nat. Lab IEEE/NPPS Radiat. Effects Committee Defence Nuclear Agency/DoD Sandia National Laboratories/DOE Jet Propulsion Laboratory/NASA Phillips Lab./DoD |
| Starting Page | 2433 |
| Ending Page | 2437 |
| Page Count | 5 |
| File Size | 1198235 |
| File Format | |
| ISSN | 00189499 |
| Volume Number | 52 |
| Issue Number | 6 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2005-12-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Random access memory Shape Acceleration Error analysis Performance evaluation Particle beams Performance analysis Error correction Circuits Memory architecture radiation effects on memory ICs Multi-bit upsets (MBUs) |
| Content Type | Text |
| Resource Type | Article |
| Subject | Nuclear and High Energy Physics Electrical and Electronic Engineering Nuclear Energy and Engineering |
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