NDLI: Built-in self-test structure for fault detection of charge-pump phase-locked loop

Content Provider	IET Digital Library
Author	Xia, Lanhua Wu, Jianhui Huang, Cheng Zhang, Meng
Abstract	A defect-oriented built-in self-test (BIST) structure of charge-pump phase-locked loop (CP-PLL) for high fault coverage and low area overhead test solution is proposed. It employs a new structure of phase/frequency detector, a D flip-flop and some existing blocks in the PLL as the input stimulus generator and fault feature extracted devices for testing evaluation. Thus, no extra test stimulus or high-performance measured instruments are required for test. The structure is easily implemented and has a little influence on the performance of CP-PLL. Fault simulation results indicate that the proposed BIST structure has high fault coverage (98.75%) and low area overhead (0.78%).
Starting Page	317
Ending Page	321
Page Count	5
ISSN	1751858X
Volume Number	10
e-ISSN	17518598
Issue Number	Issue 4, Jul (2016)
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/iet-cds/10/4
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/10.1049/iet-cds.2015.0224
Journal	IET Circuits, Devices & Systems
Publisher Date	2016-07-01
Access Restriction	Open
Rights Holder	© The Institution of Engineering and Technology
Subject Keyword	Analogue Circuit BIST Structure Built-in Self Test Charge Pump Circuit Charge Pump Phase Locked Loop D Flip-flop Defect-oriented Built-in Self-test Structure Demodulator Discriminators And Mixers Fault Coverage Fault Detection Fault Simulation Feature Extracted Device Flip Flops Frequency Detector Logic Circuit Modulator Overhead Test Solution Phase Detector Phase Locked Loop Power Electronics Power Supply Stimulus Generator Supervisory Circuit
Content Type	Text
Resource Type	Article
Subject	Control and Systems Engineering Electrical and Electronic Engineering

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