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| Content Provider | IET Digital Library |
|---|---|
| Author | Hwang, Yongha Paydar, O. H. Ho, M. Rosenzweig, J. B. Candler, R. N. |
| Abstract | The depth-dependent changes of macroporous etching in aqueous hydrofluoric (HF) solutions are addressed. Macroporous etching of n-type silicon in HF acid produces high aspect ratio structures. However, an irregular etch profile can emerge as the pore depth increases, in particular branched regions emerging from vertical pores. The root cause of this non-ideal etch profile is investigated, focusing on the dark current component of electrochemical etching. The dark current during etch progression was simulated, and it was found that increased dark current resulted from increasing the interfacial contact between the electrolyte and silicon surface. A software-mediated photocurrent compensation method is developed that periodically samples the dark current component of the etch and adjusts the overall etch current, achieving stable pore formation. |
| Starting Page | 1373 |
| Ending Page | 1375 |
| Page Count | 3 |
| ISSN | 00135194 |
| Volume Number | 50 |
| e-ISSN | 1350911X |
| Issue Number | Issue 19, Sep (2014) |
| Alternate Webpage(s) | https://digital-library.theiet.org/content/journals/el/50/19 |
| Alternate Webpage(s) | https://digital-library.theiet.org/content/journals/10.1049/el.2014.1662 |
| Journal | Electronics Letters |
| Publisher Date | 2014-09-01 |
| Access Restriction | Open |
| Rights Holder | © The Institution of Engineering and Technology |
| Subject Keyword | Aqueous Hydrofluoric Solutions Dark Conductivity Dark Current Component Electrochemical Analysis Electrochemical Analytical Method Electrochemical Macroporous Silicon Etching Electrochemistry And Electrophoresis Electrolyte Elemental Semiconductor Etching Interfacial Contact Photoconducting Material And Property Photoconduction And Photovoltaic Effect Photoconductivity Photodielectric Effect Semiconductor Technology Silicon Silicon Surface Software-mediated Photocurrent Compensation Method Surface Topography Measurement Surface Treatment And Coating Technique |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electrical and Electronic Engineering |
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