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Content Provider | IET Digital Library |
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Author | Butzen, P. F. Slimani, M. Wang, Y. Cai, H. Naviner, L. A. B. |
Abstract | A reliable majority voter circuit using a nanometre spin transfer torque magnetic tunnel junction (STT-MTJ) is presented. The circuit tolerates single transient faults and manages process variations due to technology downscaling. The use of this magnetic device brings non-volatility memory to logic circuits and promises to overcome the rising standby power issue. By using the STMicroelectronics fully depleted silicon on insulator 28 nm design kit and a precise STT-MTJ compact model, electrical simulations have been carried out to show its low-power and high reliability performances. |
Starting Page | 47 |
Ending Page | 49 |
Page Count | 3 |
ISSN | 00135194 |
Volume Number | 52 |
e-ISSN | 1350911X |
Issue Number | Issue 1, Jan (2016) |
Alternate Webpage(s) | https://digital-library.theiet.org/content/journals/el/52/1 |
Alternate Webpage(s) | https://digital-library.theiet.org/content/journals/10.1049/el.2015.2738 |
Journal | Electronics Letters |
Publisher Date | 2015-11-12 |
Access Restriction | Open |
Rights Holder | © The Institution of Engineering and Technology |
Subject Keyword | Fully Depleted Silicon on Insulator Integrated Circuit Reliability Logic And Switching Circuit Logic Circuit Magnetic Device Magnetic Tunnelling Magneto-acoustic Wave Device Magnetoresistive Wave Device Magnetostrictive And Magnetostatic Wave Device Majority Voter Circuit Reliability Mathematical Analysis MRAM Device Nonvolatility Memory Process Variation Reliability Silicon-on-insulator Size 28 Nm Spin Transfer Torque Magnetic Tunnel Junction STMicroelectronics Storage Application STT-MTJ Technology Downscaling Torque Transient Analysis Transient Fault |
Content Type | Text |
Resource Type | Article |
Subject | Electrical and Electronic Engineering |
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