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Content Provider | IET Digital Library |
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Author | Yazid, M. |
Abstract | A new method for reducing input-referred thermal noise of dynamic comparator circuit without increasing load capacitance as commonly used in the conventional method is proposed. An implementation circuit with selectable low-noise mode operation is presented, which enable both low-noise mode and standard mode operation by a single circuit. Simulation in 180 nm CMOS process technology shows that the proposed new method and circuit topology can achieve up to 90% increase in gain of comparator first stage, resulting in up to 40% decrease in input-referred thermal noise voltage, compared with a conventional circuit with similar load capacitance. The proposed circuit is also able to operate with similar performance as the conventional circuit when low-noise mode operation is not necessary. |
Starting Page | 1210 |
Ending Page | 1212 |
Page Count | 3 |
ISSN | 00135194 |
Volume Number | 54 |
e-ISSN | 1350911X |
Issue Number | Issue 21, Oct (2018) |
Alternate Webpage(s) | https://digital-library.theiet.org/content/journals/el/54/21 |
Alternate Webpage(s) | https://digital-library.theiet.org/content/journals/10.1049/el.2018.5484 |
Journal | Electronics Letters |
Publisher Date | 2018-09-10 |
Access Restriction | Open |
Rights Holder | © The Institution of Engineering and Technology |
Subject Keyword | Circuit Topology CMOS Integrated Circuit CMOS Logic Circuit CMOS Process Technology Comparator First Stage Comparators (circuits) Digital Circuit Digital Circuit Design, Modelling And Testing Flip Flops Input-referred Thermal Noise Voltage Load Capacitance Logic And Switching Circuit Logic Circuit Logic Design Method Low-noise Dynamic Comparator Circuit Low-noise Mode Operation Size 180 Nm Statistics Thermal Noise |
Content Type | Text |
Resource Type | Article |
Subject | Electrical and Electronic Engineering |
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