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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Zhanqiang Jia Jinyan Cai Yuying Liang Chunhui Han |
| Copyright Year | 2009 |
| Description | Author affiliation: Department of Optics and Electrics Engineering, Ordnance Engineering College Heping West road 97, 050003 Shijiazhuang, China (Zhanqiang Jia; Jinyan Cai; Yuying Liang; Chunhui Han) |
| Abstract | In order to evaluate the reliability guidelines for electronic equipment with high reliability and long life quickly, this paper presents the method of step-up-stress accelerated degradation testing. First expatiate step-up-stress accelerated degradation testing and the basic assumptions in detailed, then gives the data conversion method from step up stress degradation data to constant stress degradation data; At the basis, propose step up stress accelerated degradation reliability assessment arithmetic based on random degradation path; A numerical example was given to illustrate the method in the end. The testing method overcomes the shortages of constant degradation testing, which has higher testing efficiency. |
| File Size | 123502 |
| File Format | |
| ISBN | 9781424438631 |
| DOI | 10.1109/ICEMI.2009.5274869 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-08-16 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Electronic equipment Electronic equipment testing Life testing Reliability assessment Random degradation path Stress Step-up-stress accelerated degradation testing (SUSADT) Guidelines Degradation Data conversion Life estimation Acceleration Arithmetic |
| Content Type | Text |
| Resource Type | Article |
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