NDLI: Performance and area tradeoffs in space-qualified FPGA-based time-of-flight systems

Content Provider	IEEE Xplore Digital Library
Author	Hsiong, W. Huntzicker, S. King, K. Lee, A. Chen Lim Wang, J. Harris, S. Jahn, J.-M.
Copyright Year	2009
Description	Author affiliation: Harvey Mudd College, 301 Platt Blvd, Claremont, CA 91711, USA (Hsiong, W.; Huntzicker, S.; King, K.; Lee, A.; Chen Lim; Wang, J.; Harris, S.) \|\| Southwest Research Institute, 6220 Culebra Road, San Antonio, TX 78228, USA (Jahn, J.-M.)
Abstract	This paper introduces four FPGA-based designs for radiation-tolerant time-of-flight (TOF) systems for sub-atomic particles: Snapshot, Vernier, Fast-Clocking and Hybrid designs. The designs measure TOFs ranging from 0 to 240 ns and are compared based on resolution, thermal performance, FPGA I/O pin usage and area, particle processing rate, and power consumption. All designs are implemented and tested on an Actel ProASIC 3E A3PE1500 FPGA using only the features available on the radiation-tolerant Actel RTAX 2000 S/SL. The designs achieve resolutions of 130 ps to 25 ns and particle rates of 1.63 to 40 MHz, use from 0.02% to 7.5% of the FPGA area, and consume from 396 to 448 mW. The TOF measurements of the Fast-Clocking Design show no thermal variation across the ranges of −25°C to 55°C. The other three designs vary linearly with temperature, but this variation can be calibrated using a temperature sensor. All four designs offer a flexible, inexpensive TOF measurement system that can be implemented across a broad range of FPGAs.
File Size	188795
File Format	PDF
ISBN	9781424438631
DOI	10.1109/ICEMI.2009.5274555
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-08-16
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Costs Area measurement Delay lines Integrated circuit measurements Plasma measurements Hardware design languages Field programmable gate arrays Flip-flops Clocks Testing
Content Type	Text
Resource Type	Article

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