NDLI: A research on calibration of low-precision MEMS inertial sensors

Content Provider	IEEE Xplore Digital Library
Author	Ren Wei Zhang Tao Zhang Hai-yun Wang Lei-gang Zhou Yong-jie Luan Meng-kai Liu Hui-feng Shi Jing-wei
Copyright Year	2013
Description	Author affiliation: NEC Labs. China, Beijing, China (Liu Hui-feng; Shi Jing-wei) \|\| Space Center, Tsinghua Univ., Beijing, China (Ren Wei; Zhang Hai-yun; Zhou Yong-jie) \|\| Dept. of Autom., Tsinghua Univ., Beijing, China (Zhang Tao; Wang Lei-gang; Luan Meng-kai)
Abstract	Micro-electromechanical systems (MEMS) are an emerging technology that has the potential for a multitude of uses. MEMS sensors are cost-effective units with small dimensions, but suffer from large random errors compared with their mechanical predecessors. It is hard to have an accurate description of sensor errors because the characteristics of errors are quite different among the MEMS inertial sensors with the same specifications. Installation errors result from the imperfection in welding the MEMS sensor which consists of a triaxial accelerometer and a triaxial gyroscope on a single-chip. Low-precision MEMS inertial sensors exhibit biases, scale factors, and large installation errors. According to the error characteristics of MEMS inertial sensors, a mathematical model was analyzed. The validity of the six-position test was verified by using the correction between the triaxial accelerometer and the triaxial gyroscope on one single-chip. One method to identify the intersection angle among the sensitive axes and the measured vector was analyzed. The test results show that the calibration can effectively correct the bias, scale factor and installation error of MEMS inertial sensors.
Sponsorship	IEEE Control Syst. Soc.
Starting Page	3243
Ending Page	3247
File Size	357005
Page Count	5
File Format	PDF
ISBN	9781467355339
e-ISBN	9781467355346
DOI	10.1109/CCDC.2013.6561506
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-05-25
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Micromechanical devices Accelerometers MEMS gyroscope Installation errors MEMS accelerometer Vectors Gyroscopes Sensors Calibration Mathematical model Six-position test
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in