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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Yin-Po Hung Tao-Chih Chang Ching-Kuan Lee Yuan-Chang Lee Jing-Yao Chang Shin-Yi Huang Chao-Kai Hsu Shu-Man Li Jui-Hsiung Huang Fang-Jun Leu Ren-Shin Cheng Yu-Wei Huang Tai-Hong Chen |
| Copyright Year | 2010 |
| Description | Author affiliation: Assembly and Reliability Technology Department, Packaging Technology Division, EOL, ITRI, No. 195, Sec.4, Chung-Hsing Rd., ChuTung, HsingChu, Taiwan 31040 (Yin-Po Hung; Tao-Chih Chang; Ching-Kuan Lee; Yuan-Chang Lee; Jing-Yao Chang; Shin-Yi Huang; Chao-Kai Hsu; Shu-Man Li; Jui-Hsiung Huang; Fang-Jun Leu; Ren-Shin Cheng; Yu-Wei Huang; Tai-Hong Chen) |
| Abstract | As high-speed, high-density, and high-performance are the primary IC development targets, packaging technologies play a key role to bring out the best performance of those ICs. In this paper, an active component formed by an active chip embedded technology is developed for the package of a high speed DDR2 memory device. Embedding of semiconductor chips into an organic substrate provide a solution to miniaturize the size of the package. Moreover, stacking multiple layers of embedded components can allow an even higher capacity of devices and packaging density. In addition to wire bonding or w-BGA technologies, embedded package structure provides an alternative means to form redistribution circuits and electrical bonding pads. Meanwhile the electrical performance can be enhanced due to the wafer level package-like structure. Superior electrical performance is provided by forming shorter electrical path from chip pad to outer. In this study, a chip-in-substrate package (CiSP) with a real 50 um thick DDR2 memory IC is achieved using built-up technologies such as dielectric layer lamination, micro via drilling, and redistribution layer forming to implement the JEDEC-compliant DDR2 component. The PCB compatible process is a low-cost, high-yield, and versatile technology. Electrical performance similar to wafer level package and even better than wire bonding or w-BGA package can be achieved by adopting this proposed solution. The DDR2 component is assembled on a dual in-line memory module (DIMM) to study the feasibility and electrical performance of this developed package. Subsequent reliability test such as thermal cycle test (TCT) and thermal humidity storage test (THST) are examined. And electromigration (EM) of this test vehicle under high current density is simulated and tested. |
| Starting Page | 1 |
| Ending Page | 4 |
| File Size | 1019386 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424497836 |
| ISSN | 21505942 |
| e-ISBN | 9781424497867 |
| e-ISBN | 9781424497850 |
| DOI | 10.1109/IMPACT.2010.5699572 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-10-20 |
| Publisher Place | Taiwan |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Etching Dielectrics Copper Reliability Substrates Vehicles |
| Content Type | Text |
| Resource Type | Article |
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