NDLI: Distinguishing Resistive Small Delay Defects from Random Parameter Variations

Content Provider	IEEE Xplore Digital Library
Author	Xi Qian Singh, A.D.
Copyright Year	2010
Abstract	As technology scales, resistive defects, particularly via voids, are becoming an increasing problem. While such defects may only cause a small timing increase along some signal paths during test, they often grow and lead to early life failures in the field. Testing for small delay defects is therefore receiving considerable attention in recent years because the traditional burn-in approach to screen out such “infant mortality” failures is becoming prohibitively expensive in nanometer scale technologies. Unfortunately, random process variations can give rise to variability in circuit timing comparable to the resistive delay faults being targeted. This makes it critical to distinguish between the two so as to avoid discarding slow parts that are not reliability risks and can in fact be appropriately speed binned and safely used. In this paper we present a innovative strategy to show how this can be done by observing the relative change to switching delay of the slow path with variation in the power supply voltage. Our proposed approach exploits a novel key observation that the relative delay contribution of a performance outlier transistor increases noticeably with decreasing VDD, while the relative delay contribution from resistive delay defects decreases with increasing VDD.
Starting Page	325
Ending Page	330
File Size	329921
Page Count	6
File Format	PDF
ISBN	9781424488414
ISSN	10817735
DOI	10.1109/ATS.2010.62
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-12-01
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Delay Logic gates Circuit faults Clocks Integrated circuit modeling Transistors early life failure Small delay defect variability
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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