NDLI: Particle Swarm Optimization Based Scheme for Low Power March Sequence Generation for Memory Testing

Content Provider	IEEE Xplore Digital Library
Author	Kumar, K.S. Kaundinya, S. Chattopadhyay, S.
Copyright Year	2010
Abstract	Testing current high density memory chips using older algorithms is highly time consuming. March test of O(n) is the most widely used approach for its high fault coverage and systematic way of extending the test sequences. Size of the March test is guided by the number of fault models. Most of the March test generation algorithms reported so far, takes long time especially in case of number of operations exceeding seven. In this work, we propose a Particle Swarm Optimization (PSO) based March test generator which gives tests of high fault coverage, at a much lesser time compared to the existing approaches. Since the time to generate long March tests increases rapidly, in this work, we show that combining March tests of shorter lengths can replace the long March sequences without compromising fault coverage. Another bottleneck in memory testing is the power dissipation. The fitness function of the proposed PSO can be tuned to obtain March tests with high fault coverage, low power consumption, reduced peak power or a combination of any of these three. The experiments carried out confirm the effectiveness of our approach as it produces better results than those reported in the literature.
Starting Page	401
Ending Page	406
File Size	307859
Page Count	6
File Format	PDF
ISBN	9781424488414
ISSN	10817735
DOI	10.1109/ATS.2010.75
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-12-01
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit faults Technical Activities Guide - TAG Testing Couplings Random access memory Generators Transistors PSO Bit oriented SRAM Memory testing March tests Low power testing
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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