NDLI: A diversified memory built-in self-repair approach for nanotechnologies

Content Provider	IEEE Xplore Digital Library
Author	Nicolaidis, M. Achouri, N. Anghel, L.
Copyright Year	2004
Description	Author affiliation: iRoC Technol., Grenoble, France (Nicolaidis, M.; Achouri, N.)
Abstract	Memory built in self repair (BISR) is gaining importance since several years. Because defect densities are increasing with submicron scaling, more advanced solutions may be required for memories to be produced with the upcoming nanometric CMOS process generations. This problem will be exacerbated with nanotechnologies, where defect densities are predicted to reach levels that are several orders of magnitude higher than in current CMOS technologies. For such defect densities, traditional memory repair is not adequate. This work presents a diversified repair approach merging ECC codes and self-repair, for repairing memories affected by high defect densities. The approach was validated by means of statistical fault injection simulations considering defect densities as high as 3*10/sup -2/% (3% of cells are defective). The obtained results show that the approach provides close to 100% memory yield, by means of reasonable hardware cost, for technologies of very poor quality. Thus, the extreme defect densities that many authors predict for nanotechnologies do not represent a show-stopper, at least as concerning memories.
Sponsorship	IEEE Comput. Soc. Test Technol. Tech. Council
Starting Page	313
Ending Page	318
File Size	1364698
Page Count	6
File Format	PDF
ISBN	0769521347
ISSN	10930167
DOI	10.1109/VTEST.2004.1299258
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-04-25
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	CMOS technology Circuit faults Costs Testing Chemical technology Circuit synthesis Network synthesis Fault tolerance CMOS process Error correction codes
Content Type	Text
Resource Type	Article

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