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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Bhattacharya, S. Srinivasan, G. Cherubal, S. Halder, A. Chatterjee, A. |
| Copyright Year | 2004 |
| Description | Author affiliation: Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA (Bhattacharya, S.; Srinivasan, G.) |
| Abstract | In this paper, a novel algorithm has been proposed to measure system specifications of an integrated transmitter, which capture the non-linearities of the system-under-test. The measurement of these specifications is important, as these determine the amount of "interference" created by the transmitting system in adjacent channels while transmitting data in a specific channel. By using an optimized periodic bit stream, with energy concentrated at fewer frequencies, all the specifications of interest are measured. This requires fewer measurements and hence, significantly reduced test time compared to standard test techniques. Studies show that the test time can be reduced considerably by changing the number of periods of the optimum bit-sequence without losing accuracy in measurement. The number of test measurements was reduced by a factor of two. Overall, using the proposed approach, more than an order of magnitude reduction in test time was achieved, while the different specifications were measured up to a maximum accuracy of /spl plusmn/0.2% of the actual value. |
| Sponsorship | IEEE Comput. Soc. Test Technol. Tech. Council |
| Starting Page | 229 |
| Ending Page | 234 |
| File Size | 1430122 |
| Page Count | 6 |
| File Format | |
| ISBN | 0769521347 |
| ISSN | 10930167 |
| DOI | 10.1109/VTEST.2004.1299248 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2004-04-25 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | System testing Radio frequency Transmitters Time measurement Frequency measurement Measurement standards Linearity Baseband Power generation Digital signal processing |
| Content Type | Text |
| Resource Type | Article |
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