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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Woongje Sung Huang, A.Q. Baliga, B.J. |
| Copyright Year | 2010 |
| Description | Author affiliation: Future Renewable Electric Energy Delivery and Management (FREEDM) Systems Center, North Carolina State University, Raleigh, NC 27695, USA (Woongje Sung; Huang, A.Q.; Baliga, B.J.) |
| Abstract | A novel IGBT structure with a built-in lateral JFET region is proposed to reduce the saturation current. A low saturation current level for high voltage IGBTs is desirable for strong short circuit capability. The saturation current can be reduced by increasing the cell pitch of the conventional IGBT structure at the sacrifice of increased on-state voltage drop. The proposed structure provides a greatly improved tradeoff between saturation current and forward voltage drop. Furthermore, reduced saturation current in the IGBT limits the reverse recovery current of the freewheeling diode without substantial increase of the turn-on energy loss at reduced di/dt and prevents the snappiness of the diode during reverse recovery. In this paper, the viability of the new structure is demonstrated using 15kV 4H-SiC devices by 2-D simulations. The proposed new structure can also be applied to devices in other materials and other voltage ratings. |
| Starting Page | 217 |
| Ending Page | 220 |
| File Size | 192310 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424477180 |
| ISSN | 19460201 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-06-06 |
| Publisher Place | Japan |
| Access Restriction | Subscribed |
| Rights Holder | Inst of Elec Eng of Japan |
| Subject Keyword | Insulated gate bipolar transistors Circuits Voltage Temperature Thermal resistance Semiconductor diodes Energy loss Conducting materials Thermal conductivity Current density |
| Content Type | Text |
| Resource Type | Article |
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