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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Faucher, M. Walter, B. Rollier, A.-S. Seguini, K. Legrand, B. Couturier, G. Aime, J.-P. Bernard, C. Boisgard, R. Buchaillot, L. |
| Copyright Year | 2007 |
| Description | Author affiliation: Inst. d'Electron. de Microelectronique et de Nanotechnologie, Lille (Faucher, M.; Walter, B.; Rollier, A.-S.; Seguini, K.; Legrand, B.) |
| Abstract | We present the first implementation of an atomic force microscope (AFM) probe using bulk- mode silicon resonators. This probe is developed in order to perform force or dissipation spectroscopy and to enable AFM imaging in liquids thanks to reduced dissipation effects. We show that balanced tip integration allows the probe to operate in a lateral mode derived from elliptical bulk modes of circular plates. A proof-of-concept technological realization opens up the way to first AFM experiments using this resonator around 7 MHz frequencies. |
| Starting Page | 1529 |
| Ending Page | 1532 |
| File Size | 897699 |
| Page Count | 4 |
| File Format | |
| ISBN | 1424408415 |
| DOI | 10.1109/SENSOR.2007.4300436 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2007-06-10 |
| Publisher Place | France |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Probes Silicon Atomic force microscopy Optical resonators Q factor Force sensors Hydrodynamics Resonant frequency Oscillators Atomic measurements Force sensing Resonators Atomic Force Microscopy |
| Content Type | Text |
| Resource Type | Article |
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