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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Jae-hong Kim Wun-ki Jung Seung-hyun Lim Yu-jin Park Won-ho Choi Yun-jung Kim Chang-eun Kang Ji-hun Shin Kyo-jin Choo Won-baek Lee Jin-kyeong Heo Byung-jo Kim Se-jun Kim Min-ho Kwon Kwi-sung Yoo Jin-ho Seo Seog-heon Ham Chi-young Choi Gab-soo Han |
| Copyright Year | 2012 |
| Description | Author affiliation: Samsung Electronics, Yongin, Korea (Jae-hong Kim; Wun-ki Jung; Seung-hyun Lim; Yu-jin Park; Won-ho Choi; Yun-jung Kim; Chang-eun Kang; Ji-hun Shin; Kyo-jin Choo; Won-baek Lee; Jin-kyeong Heo; Byung-jo Kim; Se-jun Kim; Min-ho Kwon; Kwi-sung Yoo; Jin-ho Seo; Seog-heon Ham; Chi-young Choi; Gab-soo Han) |
| Abstract | The demand for high-quality and high-speed imaging has increased. Column-parallel ≥14b A/D conversion is one of the major approaches to meet these requirements in CMOS image sensors (CIS). Oversampling ADCs such as incremental delta-sigma (I-ΔΣ) ADCs are the solution for a high-resolution ADC having tolerance of analog component errors. Oversampling reduces input temporal noise as well as the quantization error of the ADC itself [1]. However, an I-ΔΣ ADC is also classified as a slow ADC because it requires exponential conversion time to get higher bit resolution. To reduce conversion time, there are two alternative methods: 1) higher-order modulation, and 2) two-step conversion such as an extended-counting technique [2]. In this paper, the extended-counting (EC) method is used since a high-order structure requires more complex hardware and greater power consumption [1,2]. For a general two-step ADC, coarse conversion restricts the total ADC resolution since it determines accuracy of the residue. However, an EC ADC overcomes the accuracy limitation, since the I-ΔΣ can improve its precision through oversampling. Moreover, oversampling also suppresses the noise of the pixel's source follower. Our 14b EC ADC is a blend of a $1^{st}-order$ I-ΔΣ ADC and a cyclic ADC to simultaneously get high resolution and high speed. |
| Starting Page | 390 |
| Ending Page | 392 |
| File Size | 298657 |
| Page Count | 3 |
| File Format | |
| ISBN | 9781467303767 |
| ISSN | 01936530 |
| e-ISBN | 9781467303774 |
| DOI | 10.1109/ISSCC.2012.6177060 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2012-02-19 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Noise Clocks Solid state circuits CMOS image sensors Noise measurement Signal resolution Image resolution |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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