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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Shahmohammadi, M. Harrington, B. P. Abdolvand, R. |
| Copyright Year | 2010 |
| Description | Author affiliation: Oklahoma State University, Tulsa, United States (Shahmohammadi, M.; Harrington, B. P.; Abdolvand, R.) |
| Abstract | In this paper we demonstrate that quality factor (Q) and power handling, two inherently divergent characteristics of a resonator, can be improved simultaneously by designing high-order harmonic resonant structures anchored with multiple tethers. We show that in thin-film piezoelectric-on-substrate (TPoS) resonators, the quality factor is significantly altered by varying the resonator's thickness, but the resonator's power handling is often traded off for the higher Q. Q's measured from TPoS resonators fabricated on a 30µm thick silicon substrate are up to 3 times higher than the values measured for devices on 20µm thick substrate while maximum deliverable power (at the bifurcation point) to the same device is reduced from 2.5dBm to −0.3dBm. In contrast, it is observed that the maximum deliverable power in a multi-tether ∼1GHz resonator is enhanced by more than 5dBm compared to an identical single-pair tethered resonator (7dBm versus 1.9dBm) and the Q is also increased by 55%. |
| Starting Page | 1 |
| Ending Page | 1 |
| File Size | 103650 |
| Page Count | 1 |
| File Format | |
| ISBN | 9781424460564 |
| ISSN | 0149645X |
| e-ISBN | 9781424460588 |
| e-ISBN | 9781424460571 |
| DOI | 10.1109/MWSYM.2010.5516022 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-05-23 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Q factor Power measurement Q measurement Thickness measurement Substrates Power system harmonics Resonance Piezoelectric films Semiconductor thin films Thin film devices |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electrical and Electronic Engineering Radiation |
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