NDLI: Collective scattering technique for sub-millimeter wavelength fluctuation detection in a helicon plasma

Content Provider	IEEE Xplore Digital Library
Author	Hardin, R. Scime, E. Biloiu, C. Heard, J.
Copyright Year	2004
Description	Author affiliation: Dept. of Phys., West Virginia Univ., Morgantown, WV, USA (Hardin, R.; Scime, E.; Biloiu, C.)
Abstract	Summary form only given. A possible explanation for the high RF absorption efficiency of helicon sources is the damping of the slow wave, the so called "Trivelpiece-Gould" wave, at the plasma edge in a helicon discharge. Because of the extremely short wavelength of the slow wave (less than 1 mm) direct measurements of the slow wave are not possible with standard electrostatic probes. We report on the development of a simple, portable diagnostic capable of directly measuring sub-millimeter wavelength fluctuations in helicon sources. The technique is based on collective scattering principles in which a plane polarized electromagnetic wave scatters off an electron density fluctuation in the plasma with a fraction of scattered light being detected at an angle /spl theta/ relative to the direction of the incident wave. Similar measurements are routinely performed in fusion plasmas. Our quasi-optical diagnostic, operating at 288 GHz, will be capable of measuring fluctuation wavelengths from .63 to 6.3 mm (k/sub /spl perp//=100-10 cm/sup -1/). As shown by Kline et al., waves with k/sub /spl perp///spl sim/10 cm/sup -1/ are routinely observed in HELIX. The scattered signal is measured with a homodyne detector with sufficient time resolution to detect waves in the frequency range of 1 kHz to 50 MHz.
Sponsorship	Plasma Sci. and Applications Committee of the IEEE Nuclear and Plasma Sci. Soc
File Size	79694
File Format	PDF
ISBN	0780383346
ISSN	07309244
DOI	10.1109/PLASMA.2004.1340173
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-07-01
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fluctuations Plasma waves Plasma measurements Electromagnetic scattering Light scattering Wavelength measurement Electromagnetic measurements Plasma sources Plasma diagnostics Electrostatic measurements
Content Type	Text
Resource Type	Article
Subject	Atomic and Molecular Physics, and Optics Condensed Matter Physics Electrical and Electronic Engineering

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