NDLI: Silicon photodiode soft X-ray detectors

Content Provider	IEEE Xplore Digital Library
Author	Idzorek, G.C. Bartlett, R.J.
Copyright Year	1997
Description	Author affiliation: Los Alamos Nat. Lab., NM, USA (Idzorek, G.C.)
Abstract	Summary form only given, as follows. Advanced fabrication techniques have produced UV/soft X-ray silicon photodiodes of uniform quality with thin (60 Angstrom) entrance windows and response times on the order of 100 picoseconds. We have assembled these advanced diodes into small individual detectors and detector arrays used on our plasma diagnostic experiments. Synchrotron X-ray and visible light calibration measurements show an essentially flat response from 10 eV to 600 eV as theoretically expected. Above 600 eV detector response increases above the theoretical calculation due to transmission through an approximately 8000 Angstrom thick SiO/sub 2/ protective layer surrounding the central 'active' area of the diode. Measurements on a number of diodes verify the manufacturer's claim of diode to diode response variation of about 5%. Pulsed soft X-ray calibrations show an increase in time response as a function of increased signal level and reduced bias voltage. Silicon photodiodes are the ideal detectors for soft X-ray measurements as they are much more stable and less variable in response than photoemissive detectors and much less costly than photoconductive diamond sensors. These characteristics coupled with the fast time response of the advanced silicon diodes make them excellent sensors for the soft X-ray diagnostics required on plasma experiments.
File Size	96771
File Format	PDF
ISBN	0780339908
ISSN	07309244
DOI	10.1109/PLASMA.1997.605113
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1997-05-19
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Silicon Photodiodes X-ray detectors Diodes Plasma measurements Plasma diagnostics Calibration Time factors X-ray detection Sensor phenomena and characterization
Content Type	Text
Resource Type	Article
Subject	Atomic and Molecular Physics, and Optics Condensed Matter Physics Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Silicon photodiode soft X-ray detectors for pulsed power experiments

Soft X-rays Measurements in a Dense Plasma Focus

Absolute Spectral Radiation from 200-ns X-pinch Plasma

Application of Non-Interferometric Phase Sensitive Visible/UV Diagnostics in Three and Four-Dimensions and Extension of Non-Interferometric Phase Sensitive Diagnostics into the Soft X-Ray Regime

Identification of the small-scale x-ray perturbations during magnetic reconnection in the T-10 tokamak plasma

Spectral unfold techniques for z-pinch implosions

Characterization of a 500J Dense Plasma Focus for Producing Soft x-rays

Low energy X-Ray plasma diagnostics calibration and characterization at National Security Technologies' X-Ray Lab

Spectroscopic Measurements on a Plasma-Filled Paraxial X-Ray Radiography Diode

Silicon photodiode soft X-ray detectors

Similar Documents

Silicon photodiode soft X-ray detectors for pulsed power experiments

Soft X-rays Measurements in a Dense Plasma Focus

Absolute Spectral Radiation from 200-ns X-pinch Plasma

Application of Non-Interferometric Phase Sensitive Visible/UV Diagnostics in Three and Four-Dimensions and Extension of Non-Interferometric Phase Sensitive Diagnostics into the Soft X-Ray Regime

Identification of the small-scale x-ray perturbations during magnetic reconnection in the T-10 tokamak plasma

Spectral unfold techniques for z-pinch implosions

Characterization of a 500J Dense Plasma Focus for Producing Soft x-rays

Low energy X-Ray plasma diagnostics calibration and characterization at National Security Technologies' X-Ray Lab

Spectroscopic Measurements on a Plasma-Filled Paraxial X-Ray Radiography Diode

Silicon photodiode soft X-ray detectors